“Statistics of Quality Control: Sampling Inspection and Reliability” written by Suddhendu Biswas.(NCBA)

Name: "Statistics of Quality Control: Sampling Inspection and Reliability" written by Suddhendu Biswas.(NCBA) - Booksbp.com
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SKU: 8173814333

Part 1: Statistical Process Control (SPC)

This section focuses on diagnosing variations in manufacturing lines before products are fully completed.

Control Charts for Variables: Mathematical formulation of X̄ (Mean) charts and R (Range) or S (Standard Deviation) charts to track continuous metrics like weight, volume, or diameter.
Control Charts for Attributes: Formulas for discrete data tracking, including p-charts (fraction defective), np-charts (number of defectives), c-charts (number of defects per unit), and u-charts (defects per unit area/volume).
Process Capability Analysis: Calculation of indices like \(C_{p}\) and \(C_{pk}\) to measure how accurately a manufacturing system operates within pre-determined engineering tolerances.

Part 2: Sampling Inspection Plans

This section outlines strategies for auditing large batches of incoming materials using selected, mathematically sound samples rather than inspecting 100% of the stock.

Acceptance Sampling: Designing strict boundary parameters (n, c)—where n represents the sample size and c dictates the maximum allowable defects before an entire shipment is rejected.
Sampling Systems: In-depth comparisons of Single, Double, and Sequential sampling workflows to minimize corporate overhead costs while enforcing quality targets.
Statistical Performance Curves: Detailed mapping of Operating Characteristic (OC) curves, Average Outgoing Quality (AOQ), and Average Sample Number (ASN) trends to balance the financial risk exposure between the producer and the buyer.

Part 3: Reliability Engineering

This section switches focus to the operational lifespan of a product or asset after it leaves the assembly plant.

Failure Time Distributions: Modeling failure timelines utilizing complex probability densities such as the Exponential distribution (constant failure rates), the Weibull distribution (aging variations), and Gamma distributions.
System Layout Architecture: Mathematical models evaluating system reliability based on structural assembly, contrasting Series systems (where one failure stops the line) with Parallel systems (relying on built-in redundancies).
Life Testing Plans: Statistical analysis of censored data metrics (including Type-I time-truncated and Type-II failure-truncated configurations) to determine Mean Time to Failure (MTTF).